Title :
High-frequency properties of FeCoSiB thin films with crossed anisotropy
Author :
Frommberger, Michael ; McCord, Jeffrey ; Quandt, Eckhard
Author_Institution :
Smart Mater. Group, Center for Adv. Eur. Studies & Res., Bonn, Germany
fDate :
7/1/2004 12:00:00 AM
Abstract :
Investigations on amorphous FeCoSiB/SiO2/FeCoSiB thin-film samples with crossed anisotropies are presented in this paper. The samples consist of two magnetic layers, 40 nm thick each, where the second magnetic layer´s uniaxial anisotropy is rotated by an angle of 90° with respect to the anisotropy of the first layer. The individual layers were separated by a 20 nm SiO2 thin film. The angular dependent magnetic properties of the samples have been characterized by vibrating sample and inductive magnetometry. The high-frequency (HF) response was determined by HF-permeameter measurements and pulsed inductive microwave magnetometry (PIMM). Good HF-response independent of the magnetic field excitation angle is achieved. The results are compared to an 80 nm FeCoSiB reference film with uniaxial anisotropy. Our results provide new insights important for the design of HF magnetic devices.
Keywords :
amorphous magnetic materials; boron alloys; cobalt alloys; frequency response; iron alloys; magnetic anisotropy; magnetic thin films; silicon alloys; 20 nm; 40 nm; 80 nm; FeCoSiB reference film; FeCoSiB thin films; FeCoSiB-SiO2-FeCoSiB; HF magnetic devices; HF-permeameter measurement; SiO2; amorphous FeCoSiB thin film; crossed anisotropy; high-frequency properties; high-frequency response; induced anisotropy; inductive magnetometry; magnetic field excitation angle; magnetic layers; magnetic thin films; pulsed inductive microwave magnetometry; uniaxial anisotropy rotation; Amorphous magnetic materials; Amorphous materials; Anisotropic magnetoresistance; Hafnium; Magnetic anisotropy; Magnetic field measurement; Magnetic separation; Perpendicular magnetic anisotropy; Pulse measurements; Transistors; Frequency response; induced anisotropy; magnetic thin films;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2004.832139