DocumentCode
107725
Title
Queuing Modeling Applied to Admission Control of Network Traffic Flows Considering Multifractal Characteristics
Author
De Godoy Stenico, J.W. ; Lee Luan Ling ; Teles Vieira, Flavio Henrique
Author_Institution
DECOM - Dept. de Comun., Univ. Estadual de Campinas (Unicamp), Campinas, Brazil
Volume
11
Issue
2
fYear
2013
fDate
Mar-13
Firstpage
749
Lastpage
758
Abstract
In this paper, we propose an analytical expression for estimating the byte loss probability at a single server queue with multifractal traffic arrivals. Initially we address the theory concerning multifractal processes, especially the Hölder exponents of the multifractal traffic traces. Next, we focus our attention on the second order statistics for multifractal traffic processes. More specifically, we assume that an exponential model is adequate for representing the variance of the traffic process under different time scale aggregation. Then, we compare the performance of the proposed approach with some other relevant approaches. In addition, based on the results of the analysis, we propose a new admission control strategy that takes into account the multifractal traffic characteristics. We compare the proposed admission control strategy with some other widely used admission control methods. The simulation results show that the proposed loss probability estimation method is accurate, and the proposed admission control strategy is robust and efficient.
Keywords
probability; queueing theory; telecommunication congestion control; telecommunication traffic; Holder exponents; admission control methods; byte loss probability estimation; multifractal characteristics; multifractal processes; multifractal traffic characteristics; multifractal traffic processes; multifractal traffic traces; network traffic flow admission control strategy; queuing modeling; single server queue; time scale aggregation; Adaptation models; Admission control; Computational modeling; Fractals; Process control; Wavelet transforms; Wide area networks; Control Admission; Loss Probability; Multifractal Processes;
fLanguage
English
Journal_Title
Latin America Transactions, IEEE (Revista IEEE America Latina)
Publisher
ieee
ISSN
1548-0992
Type
jour
DOI
10.1109/TLA.2013.6533964
Filename
6533964
Link To Document