DocumentCode
1077266
Title
Sputter Tracking for the Automatic Monitoring of Industrial Laser-Welding Processes
Author
Jäger, Mark ; Humbert, Silke ; Hamprecht, Fred A.
Author_Institution
Philips Res., Eindhoven
Volume
55
Issue
5
fYear
2008
fDate
5/1/2008 12:00:00 AM
Firstpage
2177
Lastpage
2184
Abstract
The importance of laser welding in industry increases. Many welds have high-quality demands, and one possibility to satisfy the quality requirements is to monitor the welding process with high-speed cameras. Laser welding is a highly dynamic process; it is therefore challenging to distinguish between normal process fluctuations and abnormal error events in the recorded sequences. This paper investigates a novel classification method to automatically analyze the recorded welding sequences and robustly find the abnormal error events. To our knowledge, it is the first time that a framework to detect and track sputters in welding sequences is proposed and evaluated. To achieve a high usability of the classification algorithm, in the training phase, the user only needs to mark suspicious sequences but does not need to label individual frames within the sequences. The framework is tested on two challenging data sets from real welding processes. The results show that the material particles can be tracked accurately. On a sample data set, the new approach finds all erroneous welds with a small false-positive rate and outperforms previously developed methods.
Keywords
classification; laser beam welding; process monitoring; quality control; abnormal error events; automatic monitoring; classification method; erroneous welds; industrial laser-welding processes; material particles; sputter tracking; welding sequences; Automated visual inspection system; Automated visual-inspection system; Computer vision; Laser welding; Particle tracking; Quality inspection; computer vision; laser welding; particle tracking; quality inspection;
fLanguage
English
Journal_Title
Industrial Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0278-0046
Type
jour
DOI
10.1109/TIE.2008.918637
Filename
4455590
Link To Document