Hysteresis modeling of thin permalloy films and parameter interpretation

Author

Haumer, Peter ; Hauser, Hans ; Fulmek, Paul L. ; Bajalan, Diyar

Author_Institution

Vienna Univ. of Technol., Austria

Volume

40

Issue

4

fYear

2004

fDate

7/1/2004 12:00:00 AM

Firstpage

2745

Lastpage

2747

Abstract

An energetic model is used to calculate macroscopic magnetization behavior of thin Permalloy films. Therefore it is extended by magnetocrystalline anisotropy energy and domain classes that particularly represent magnetization rotation. Some model parameters can be related to coherent rotation of domain magnetizations. A qualitative agreement is achieved with measurements on sputtered Permalloy films used for anisotropic magnetoresistance (AMR) sensors.

Keywords

Permalloy; anisotropic media; magnetic anisotropy; magnetic hysteresis; magnetic thin films; magnetoresistance; anisotropic magnetoresistance sensors; anisotropic media; energetic model; hysteresis modeling; macroscopic magnetization behavior; magnetic hysteresis; magnetization rotation; magnetocrystalline anisotropy energy; parameter interpretation; thin permalloy films; Anisotropic magnetoresistance; Demagnetization; Magnetic anisotropy; Magnetic domains; Magnetic films; Magnetic hysteresis; Magnetic sensors; Magnetization; Perpendicular magnetic anisotropy; Substrates; Anisotropic media; magnetic hysteresis; magnetization; magnetoresistance; permalloy films;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2004.832283

Filename

1325628