Title :
Dielectric materials at high frequencies
Keywords :
Condition monitoring; Conferences; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Intelligent transportation systems; Microwave frequencies; NIST;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2006.1667725
