DocumentCode :
1077442
Title :
Comparing two measurement techniques for high frequency characterization of power cable semiconducting and insulating materials
Author :
Mugala, Gavita ; Eriksson, Roland ; Pettersson, Per
Author_Institution :
Dept. of Electr. Eng., R. Inst. of Technol., Stockholm
Volume :
13
Issue :
4
fYear :
2006
Firstpage :
712
Lastpage :
716
Abstract :
Understanding the high frequency characteristics of the materials that make up medium voltage extruded cables is important in establishing diagnostics schemes based on electromagnetic pulse propagation methods. Two measurement techniques have been developed and used to characterize the high frequency material properties of semi-conducting screens and cross linked polyethylene (XLPE) insulation up to 100 MHz. The experimental details, parameter extraction and limitations of the two measurement techniques are presented
Keywords :
S-parameters; XLPE insulation; dielectric measurement; electromagnetic pulse; permittivity; power cable insulation; XLPE insulation; cross linked polyethylene insulation; electromagnetic pulse propagation method; high frequency characteristics; insulating material; measurement techniques; permittivity; power cable; scattering parameter extraction; semiconducting screen; Cable insulation; Electromagnetic transients; Frequency; Material properties; Measurement techniques; Medium voltage; Polyethylene; Power cables; Semiconductivity; Semiconductor materials;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2006.1667728
Filename :
1667728
Link To Document :
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