Title :
Dielectric Properties of NaCl Films
Author :
Tomlinson, Robert Duncan ; Hampshire, M.J. ; Calderwood, James H.
Author_Institution :
Department of Electrical Engineering, University of Salford, Lancashire. England
Abstract :
Al-NaCl-Ge thin-film capacitors have been produced and subsequently analyzed in a vacuum of better than 1O-7 torr. The devices show a pronounced audio-frequency dispersion peak in tan ¿, which is associated with an activation energy of 0.67 ± 0.05 eV. The NaCl films are polycrystalline with a grain size of 2 X 10-4 cm and X-ray analysis indicates a preferred orientated structure.
Keywords :
Dielectric measurements; Dielectric substrates; Dielectric thin films; Electrical resistance measurement; Frequency; Grain boundaries; Grain size; Optical films; Pollution measurement; Temperature;
Journal_Title :
Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TEI.1971.299147
