DocumentCode :
107774
Title :
Investigation on Space Environmental Degradation Effects of Solar Cell Coverglass
Author :
Yu Chen ; Jiang Wu ; Okumura, Takashi ; Takahashi, Masaharu ; Endo, T. ; Iwata, M. ; Toyoda, Kentaroh ; Cho, Moonju
Author_Institution :
State Key Lab. of Electr. Insulation & Power Equip., Xi´an Jiaotong Univ., Xi´an, China
Volume :
41
Issue :
12
fYear :
2013
fDate :
Dec. 2013
Firstpage :
3471
Lastpage :
3476
Abstract :
Based on the ground-based simulation for space irradiation environment, the degradation of CMG100-AR solar cell coverglasses produced by Qioptiq was conducted by thermal cycling at the range -160°C to +110°C, 50-keV protons irradiation, 500-keV electrons irradiation, ~ 4000 equivalent solar hours vacuum ultraviolet (UV) irradiation, and their multifactors radiation in sequence. The key parameter related to surface charging of virgin and degraded coverglasses, total electron emission yield (TEEY), was measured and discussed. The Monte Carlo simulation, infrared spectroscopy, UV-visible-near-infrared spectroscopy, and X-ray photoelectron spectroscopy spectrum were used to disclose the damage mechanism and its influence on TEEY.
Keywords :
Monte Carlo methods; X-ray photoelectron spectra; glass; infrared spectroscopy; solar cells; sunlight; CMG100-AR solar cell coverglasses; Monte Carlo simulation; UV-visible-near-infrared spectroscopy; X-ray photoelectron spectroscopy spectrum; damage mechanism; electron volt energy 50 keV; electron volt energy 500 keV; electrons irradiation; equivalent solar hours vacuum ultraviolet irradiation; ground-based simulation; infrared spectroscopy; multifactors radiation; protons irradiation; space environmental degradation effects; space irradiation environment; temperature -160 degC to 110 degC; thermal cycling; total electron emission yield measurement; Aging; Color; Degradation; Electron emission; Radiation effects; Silicon; Space vehicles; Degradation effect; photoelectron emission yield; solar cell coverglass; space environment; total electron emission yield (TEEY);
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2013.2280287
Filename :
6674083
Link To Document :
بازگشت