Investigation on Space Environmental Degradation Effects of Solar Cell Coverglass

Author

Yu Chen ; Jiang Wu ; Okumura, Takashi ; Takahashi, Masaharu ; Endo, T. ; Iwata, M. ; Toyoda, Kentaroh ; Cho, Moonju

Author_Institution

State Key Lab. of Electr. Insulation & Power Equip., Xi´an Jiaotong Univ., Xi´an, China

Volume

41

Issue

12

fYear

2013

fDate

Dec. 2013

Firstpage

3471

Lastpage

3476

Abstract

Based on the ground-based simulation for space irradiation environment, the degradation of CMG100-AR solar cell coverglasses produced by Qioptiq was conducted by thermal cycling at the range -160^°C to +110^°C, 50-keV protons irradiation, 500-keV electrons irradiation, ~ 4000 equivalent solar hours vacuum ultraviolet (UV) irradiation, and their multifactors radiation in sequence. The key parameter related to surface charging of virgin and degraded coverglasses, total electron emission yield (TEEY), was measured and discussed. The Monte Carlo simulation, infrared spectroscopy, UV-visible-near-infrared spectroscopy, and X-ray photoelectron spectroscopy spectrum were used to disclose the damage mechanism and its influence on TEEY.

Keywords

Monte Carlo methods; X-ray photoelectron spectra; glass; infrared spectroscopy; solar cells; sunlight; CMG100-AR solar cell coverglasses; Monte Carlo simulation; UV-visible-near-infrared spectroscopy; X-ray photoelectron spectroscopy spectrum; damage mechanism; electron volt energy 50 keV; electron volt energy 500 keV; electrons irradiation; equivalent solar hours vacuum ultraviolet irradiation; ground-based simulation; infrared spectroscopy; multifactors radiation; protons irradiation; space environmental degradation effects; space irradiation environment; temperature -160 degC to 110 degC; thermal cycling; total electron emission yield measurement; Aging; Color; Degradation; Electron emission; Radiation effects; Silicon; Space vehicles; Degradation effect; photoelectron emission yield; solar cell coverglass; space environment; total electron emission yield (TEEY);

fLanguage

English

Journal_Title

Plasma Science, IEEE Transactions on

Publisher

ieee

ISSN

0093-3813

Type

jour

DOI

10.1109/TPS.2013.2280287

Filename

6674083