Title :
Bayesian reliability estimation based on a weibull stress-strength model for aged power system components subjected to voltage surges
Author :
Chiodo, Elio ; Mazzanti, G.
Author_Institution :
Dept. of Electr. Eng., Univ. of Napoli
Abstract :
For original article by E. Chiodo, G. Mazzanti, see ibid., vol.13, no.1, p.146-59, February 2006
Keywords :
Bayes methods; Weibull distribution; ageing; power system reliability; surges; Bayesian reliability estimation; Weibull stress-strength model; ageing; power system components; voltage surges; Aging; Bayesian methods; Distribution functions; Integral equations; Power system modeling; Power system reliability; Radio frequency; Stress; Surges; Voltage;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2006.1667755
