DocumentCode :
1077926
Title :
Effects of trap levels in single-photon optical time-domain reflectometry: evaluation and correction
Author :
Ripamonti, Giancarlo ; Zappa, Franco ; Cova, Sergio D.
Author_Institution :
Dipartimento di Fisica, Milano Univ., Italy
Volume :
10
Issue :
10
fYear :
1992
fDate :
10/1/1992 12:00:00 AM
Firstpage :
1398
Lastpage :
1402
Abstract :
Single photon detectors used in optical time-domain reflectometry (OTDR) suffer from carrier trapping phenomena. It is shown that trapping effects can result in a severe OTDR trace distortion, and that accurate measurements of trap releases open the way to the correction of the OTDR data. A simple procedure for offline correction of the experimental traces is presented. Its applicability range is analyzed, using a Monte Carlo program which simulates the actual OTDR experiments. A great improvement of signal-to-noise ratio in single-photon OTDR is expected by exploiting the technique. Requirements for the electronics to be used for these measurements are discussed
Keywords :
Monte Carlo methods; electron traps; optical time-domain reflectometry; photodetectors; Monte Carlo program; OTDR trace distortion; offline correction; signal-to-noise ratio; single photon detectors; single-photon optical time-domain reflectometry; trap levels; trap releases; Absorption; Charge carrier processes; Detectors; Distortion measurement; Optical distortion; Optical sensors; Pulse measurements; Reflectometry; Time domain analysis; Time measurement;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/50.166782
Filename :
166782
Link To Document :
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