Title :
CIM: A Reliable Metric for Evaluating Program Phase Classifications
Author :
Kodakara, Sreekumar V. ; Kim, Jinpyo ; Lilja, David J. ; Hawkins, Douglas ; Hsu, Wei-Chung ; Yew, Pen-Chung
Author_Institution :
Univ. of Minnesota, Minneapolis
Abstract :
We propose the use of the confidence interval of estimated mean (CIM), a metric based on statistical sampling theory, to evaluate the quality of a given phase classification and for comparing different phase classification schemes. Previous research on phase classification used the weighted average of coefficient of variation (CoVwa) to estimate phase classification quality. We found that the phase quality indicated by CoVwa could be inconsistent across different phase classifications. We explain the reasons behind this inconsistency and demonstrate the inconsistency using data from several SPEC CPU2000 benchmark programs. We show that the confidence interval of estimated mean (CIM) correctly estimates the quality of phase classification with a meaningful statistical interpretation.
Keywords :
computer architecture; estimation theory; pattern classification; program compilers; program diagnostics; sampling methods; SPEC CPU2000 benchmark program; computer architecture; confidence interval; estimated mean; phase quality estimation; program phase classification; reliable metric; statistical interpretation; statistical sampling theory; Acceleration; Clustering algorithms; Computer architecture; Computer integrated manufacturing; Phase detection; Phase estimation; Phase measurement; Sampling methods; Statistics; Surges; Benchmark Analysis; Phase Classification; Quality Metric; Statistical Sampling;
Journal_Title :
Computer Architecture Letters
DOI :
10.1109/L-CA.2007.4