• DocumentCode
    1078177
  • Title

    Architecture of a Slow-Control ASIC for Future High-Energy Physics Experiments at SLHC

  • Author

    Gabrielli, A. ; De Robertis, G. ; Fiore, D. ; Loddo, F. ; Ranieri, A.

  • Author_Institution
    Phys. Dept., Univ. of Bologna, Bologna
  • Volume
    56
  • Issue
    3
  • fYear
    2009
  • fDate
    6/1/2009 12:00:00 AM
  • Firstpage
    1163
  • Lastpage
    1167
  • Abstract
    This work is aimed at defining the architecture of a new digital ASIC, namely slow control logic (SCL), which will be designed and fabricated in a commercial 130 nm CMOS technology. This chip will be embedded within a high-speed data acquisition optical link (GBT) to control and monitor the front-end electronics proposed for future high-energy physics experiments at the super-Large Hadron Collider (SLHC), CERN, Geneva. The GBT link provides a transparent transport layer between the SCL and control electronics in the counting room. It will be provided with rad-hard redundant logic for critical circuits. The project follows a set of designs that were recently developed via a 250 nm CMOS technology for LHC experiments. Since this 250 nm specific technology used to design ASICs for the LHC will no longer be available as it was in the past, requesting an update technology for future experiments must be satisfied in any case. A test chip that implements three different redundant methodologies against single event effects is also described.
  • Keywords
    CMOS integrated circuits; application specific integrated circuits; data acquisition; nuclear electronics; optical links; ASIC; CERN; CMOS technology; SLHC; control electronics; data acquisition optical link; front-end electronics; high-energy physics; single event effects; size 130 nm; size 250 nm; slow control logic; Application specific integrated circuits; CMOS logic circuits; CMOS technology; Data acquisition; Large Hadron Collider; Logic design; Monitoring; Optical control; Optical fiber communication; Physics; GBT; SCL; radiation hardness; single event effects;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2008.2009937
  • Filename
    5075935