The Effect of the Dielectric Layer Thickness on Spectral Performance of CdZnTe Frisch Collar Gamma Ray Spectrometers

Author

Kargar, Alireza ; Brooks, Adam C. ; Harrison, Mark J. ; Kohman, Kyle T. ; Lowell, Rans B. ; Keyes, Roger C. ; Chen, Henry ; Bindley, Glenn ; McGregor, Douglas S.

Author_Institution

S.M.A.RT. Lab., Kansas State Univ., Manhattan, KS

Volume

56

Issue

3

fYear

2009

fDate

6/1/2009 12:00:00 AM

Firstpage

824

Lastpage

831

Abstract

The spectral performance as a function of the dielectric layer thickness for several CdZnTe Frisch collar devices was investigated. Seven different planar bar shaped detectors were fabricated from Redlen Technologies CdZnTe, and many Frisch collar devices were prepared from each planar device. The optimum dielectric layer thickness was experimentally determined for each device. The result of the optimal thickness study was verified through three-dimensional geometry modeling of the potential and electric field. It is shown that there exists an optimal dielectric layer thickness for best performance for CdZnTe Frisch collar devices with aspect ratios (L/W) greater than 2.5.

Keywords

II-VI semiconductors; cadmium compounds; dielectric thin films; gamma-ray spectrometers; semiconductor counters; zinc compounds; 3D geometry modeling; CdZnTe; Frisch collar gamma ray spectrometers; Redlen Technologies; dielectric layer thickness; spectral performance; Charge carriers; Coatings; Detectors; Dielectric devices; Dielectrics and electrical insulation; Electric potential; Electrochemical impedance spectroscopy; Geometry; Laboratories; Radio access networks; CdZnTe Frisch collar detector; dielectric thickness;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2009.2017193

Filename

5075939