• DocumentCode
    1078240
  • Title

    Experimental Study of Pumping of Liquid Film With Electric Conduction Phenomenon

  • Author

    Siddiqui, Muhammad A W ; Seyed-Yagoobi, Jamal

  • Author_Institution
    All Chicago Inc., Chicago, IL
  • Volume
    45
  • Issue
    1
  • fYear
    2009
  • Firstpage
    3
  • Lastpage
    9
  • Abstract
    In electrohydrodynamics (EHD) conduction pumping, Coulomb force is the main driving force for fluid motion. The process of dissociation and recombination of electrolytic species produces heterocharge layers in the vicinity of electrodes. Asymmetric electrodes are used to arrange heterocharge layers to induce net motion in fluid. In this paper, EHD conduction pumping is experimentally studied with stratified liquid film in a channel. Liquid flow rate and the generated pressure are measured for different applied voltages and liquid film heights. Two different designs of electrode pairs, including flushed electrodes having virtually no drag force, are considered in this paper. Liquid pumping using EHD conduction phenomenon is significant for heat transfer and mass transport in thermal equipment of macro- and microsizes, in the presence and absence of gravity. This is particularly true for nonmechanical pumping of liquid film in phase change equipment.
  • Keywords
    channel flow; electrodes; electrohydrodynamics; heat transfer; liquid films; mass transfer; pumps; Coulomb force; electric conduction phenomenon; electrohydrodynamics conduction pumping; fluid motion; flushed electrodes; heat transfer; mass transport; nonmechanical pumping; phase change equipment; stratified liquid film; thermal equipment; Conductive films; Drag; Electrodes; Electrohydrodynamics; Fluid flow; Fluid flow measurement; Heat pumps; Heat transfer; Pressure measurement; Voltage; Conduction; electrohydrodynamics (EHD); liquid film; nonmechanical pumping; two-phase flow; zero-drag electrode;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2008.2009486
  • Filename
    4757402