DocumentCode :
1078738
Title :
The X-Ray Spectroscopic Performance of a Very Large Area Silicon Drift Detector
Author :
Zampa, Gianluigi ; Rashevsky, Alexander ; Vacchi, Andrea
Author_Institution :
Sezione di Trieste, Ist. Naz. di Fis. Nucleare, Trieste
Volume :
56
Issue :
3
fYear :
2009
fDate :
6/1/2009 12:00:00 AM
Firstpage :
832
Lastpage :
835
Abstract :
Silicon drift detectors (SDDs), due to their collection electrode geometry, have excellent noise performance and are well suited for low-energy X-ray spectroscopy applications. On the other hand these detectors, when dedicated to low energy X-ray spectroscopy, have a small sensitive area (from few square millimeters up to one square centimeter) to reduce the leakage current and its impact on the energy resolution. Because of this limitation they are rarely used in applications where large sensitive surfaces are required. We present the characterization of the spectroscopic performance of a very large sensitive area SDD (about 53 cm2) that has been realized in the frame of the LHC-ALICE experiment. We studied the energy resolution of the detector analyzing its dependence on both biasing conditions and temperature to evaluate the contribution of the different noise sources exploiting their relation with the shaping time. The experimental results obtained with 241 Am and 55 Fe sources show that the goal of a high energy resolution combined with large sensitive areas can be achieved.
Keywords :
X-ray spectroscopy; leakage currents; nuclear electronics; position sensitive particle detectors; readout electronics; semiconductor device noise; silicon radiation detectors; 241Am source; 55Fe source; LHC-ALICE experiment; X-ray spectroscopy application; biasing condition; leakage current; noise sources; read-out electrode geometry; very large area silicon drift detector; very large sensitive area SDD; Electrodes; Energy resolution; Geometry; Leak detection; Leakage current; Silicon; Spectroscopy; Temperature dependence; X-ray detection; X-ray detectors; Performance evaluation; X-ray spectroscopy; silicon drift detector;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2008.2007955
Filename :
5075988
Link To Document :
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