Title :
Underfill of flip-chip: the effect of contact angle and solder bump arrangement
Author :
Young, Wen-Bin ; Yang, Wen-Lin
Author_Institution :
Dept. of Aeronaut. & Astronaut., Nat. Cheng-Kung Univ., Tainan
Abstract :
An underfill encapsulant was used to fill the gap between the chip and the substrate around the solder joints to improve the long-term reliability of a flip-chip interconnecting system. The underfill encapsulant was filled by the capillary flow. As a part of the series studies of understanding and analysis of the underfill mechanism, this study was devoted to investigate the effects of the contact angle and the bump arrangement on the underfill flow. The Hele-Shaw flow model, that considered the flow resistance in both the thickness direction between the chip and substrate and the plane direction between solder bumps, was assumed. A modified capillary force model including the effects of the contact angle and the bump arrangement was proposed. The capillary force was formulated based on either quadrilateral or hexagonal bump arrangements. A capillary force parameter was used as an index for comparison of different bump design, including bump diameter, gap height, bump pitch, contact angle, and arrangement. A hexagonal arrangement of solder bumps was found to have a higher capillary force and better underfill efficient
Keywords :
contact angle; encapsulation; flip-chip devices; flow simulation; interconnections; reliability; Hele-Shaw flow model; bump pitch; capillary flow; capillary force parameter; contact angle; flip-chip interconnection; flip-chip underfill; flow resistance; long-term reliability; modified capillary force model; solder bump arrangement; underfill encapsulant; underfill flow; Electronic packaging thermal management; Filling; Information technology; Joining materials; Permeability; Soldering; Surface tension; Thermal expansion; Thermal stresses; Viscosity; Bump pitch; capillary flow; flip-chip; underfill; underfill flow;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/TADVP.2006.879495