DocumentCode :
1078765
Title :
An impedance measurement method for double-gap klystron cavity
Author :
Zhao, Yong-Xiang
Author_Institution :
Stanford University, Stanford, CA
Volume :
29
Issue :
2
fYear :
1982
fDate :
2/1/1982 12:00:00 AM
Firstpage :
316
Lastpage :
320
Abstract :
A new method has been developed for measuring the impedance of a two-gap cavity used in high-power klystrons. The principle is based on network analysis. The cavity under test is considered as a microwave network. The two gaps of the cavity and its output terminal are referred to as three ports. We then can use an impedance matrix to characterize this system, and the six independent impedance parameters can be found by measuring the input impedance seen from the output waveguide when the gaps are in different conditions; viz., either open, shorted, or perturbed. The gap impedance then can be deduced therefrom. It is shown that there are three impedances for a double-gap cavity instead of one for a single-gap cavity. Another problem dealt with here is how to evaluate the capacitance introduced by the perturbation. A few typical experimental results are presented.
Keywords :
Capacitance; Equations; Impedance measurement; Klystrons; Q measurement; Resonance; Testing; Transmission line matrix methods; Voltage; Waveguide discontinuities;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1982.20702
Filename :
1482199
Link To Document :
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