• DocumentCode
    1078846
  • Title

    Quadruply self-aligned stacked high-capacitance RAM using Ta2O5high-density VLSI dynamic memory

  • Author

    Ohta, Kuniichi ; Yamada, Kunio ; Shimizu, Kyozo ; Tarui, Yasuo

  • Author_Institution
    Nippon Electrical Company Ltd., Kawasaki, Japan
  • Volume
    29
  • Issue
    3
  • fYear
    1982
  • fDate
    3/1/1982 12:00:00 AM
  • Firstpage
    368
  • Lastpage
    376
  • Abstract
    A new one-transistor, one-capacitor RAM cell structure called a Quadruply Self-Aligned Stacked High Capacitance (QSA SHC) RAM is proposed as a basic cell for a future one-million-bit VLSI memory. This cell consists of a QSA MOSFET and a Ta2O5capacitor stacked on it. By this cell, the ultimate cell area 3F \\times 2F can be realized with sufficient operating margin. Here, F is the minimum feature size. The basic cell was fabricated and its operation was experimentally verified. The leakage current of Ta2O5film was small enough for the storage capacitor dielectric. Using a 3F \\times 4F cell and a 4F pitch sense amplifier, a one-million-bit memory was designed with a 2-µm rule. A cell size of 6.5 × 8 µm2, and a chip size of 9.2 × 9.5 mm2were obtained. The access time, neglecting the RC time constant of the word line, was estimated to be about 170 ns. Based on this design, it is argued that a future one-million-bit memory can be realized by QSA SHC technology with a 2-1-µm process. The mask set of the 1-Mbit RAM was actually fabricated by an electron-beam mask maker. A photomicrograph of the 1-Mbit RAM chip patterned by the mask set is shown. This chip was patterned not to get an operating sample but to show an actual chip image of the future 1- Mbit RAM. The area of each circuit block including storage array can be seen in this chip image.
  • Keywords
    Capacitance; Capacitors; Dielectrics; Image storage; Laboratories; MOSFET circuits; Random access memory; Read-write memory; Very large scale integration; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1982.20711
  • Filename
    1482208