• DocumentCode
    1079145
  • Title

    EMEC-an EM simulator based on topology

  • Author

    Carlsson, Jan ; Karlsson, Torbjörn ; Undén, Göran

  • Author_Institution
    EMC Dept., Swedish Nat. Testing & Res. Inst., Sweden
  • Volume
    46
  • Issue
    3
  • fYear
    2004
  • Firstpage
    353
  • Lastpage
    358
  • Abstract
    For the control of electromagnetic interference a topological approach is strongly recommended. It allows for a complex system to be structured into a feasible number of zones, each having certain levels of energy density, transient amplitudes, background noise, etc. Electromagnetic compatibility (EMC) is reached by making sure that all system elements comply with those levels. In this paper, a simulation program is described that facilitates the EMC specification. The user interface forces the user to adapt to the topological approach. Sources, zone properties, cables, and other coupling path etc., are specified and disturbances in arbitrary locations are computed. By comparing computed results for varying system properties with known emission and immunity properties of system elements, different ways to reach EMC can be evaluated. Including actual external threats among the sources, EMC compliance means that the system is immune to intentional electromagnetic interference, high-power electromagnetics, electromagnetic pulse, lightning, etc.
  • Keywords
    electrical engineering computing; electromagnetic compatibility; electromagnetic interference; electromagnetic compatibility analysis; electromagnetic interference; electromagnetic topology; simulation program; user interface; Background noise; Cables; Computational modeling; EMP radiation effects; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic transients; Lightning; Topology; User interfaces; EMC; Electromagnetic compatibility; MTL; analysis; electromagnetic topology; multiconductor transmission lines;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2004.831831
  • Filename
    1325789