• DocumentCode
    1079239
  • Title

    Measurement techniques for conducted HPEM signals

  • Author

    Weber, Thomas ; Ter Haseborg, Jan Luiken

  • Author_Institution
    Jenoptik Group, Extel Syst. Wedel, Germany
  • Volume
    46
  • Issue
    3
  • fYear
    2004
  • Firstpage
    431
  • Lastpage
    438
  • Abstract
    High-power electromagnetic (HPEM) signals are a serious threat for modern electronic systems. Intentionally generated electromagnetic interferences might cause upsets or permanent defects in electronics, particularly in the electronics´ interface. There are numerous military and especially civil targets, which might be interesting for criminals or terrorists to interfere. Therefore, there is a need to characterize the overall problem by means of simulations and measurements. This paper discusses measurement procedures for conducted HPEM signals. The measurement of transmission line coupled HPEM signals with a steepness in the order of 10-10E14 V/s is a very challenging task. This paper discusses the state of the art in electromagnetic pulse measurements with a focus on conducted ultra wide band and RPEM signals respectively.
  • Keywords
    electric variables measurement; electromagnetic compatibility; electromagnetic interference; electromagnetic pulse; microwave measurement; conducted HPEM signals; electromagnetic interference; electromagnetic pulse measurements; electronic system; high power electromagnetic signals; measurement techniques; transmission line coupled signals; Antenna measurements; EMP radiation effects; Electromagnetic measurements; Impedance; Magnetic sensors; Measurement techniques; Power system transients; Probes; Sensor phenomena and characterization; Transmission line measurements; Current probe; EMP; HPEM; IEMI; TEM waveguide; UWB; electromagnetic pulse; high-power electromagnetic; intentional electromagnetic interference; measurement; monopole; ultrawideband;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2004.831892
  • Filename
    1325798