DocumentCode
1079315
Title
Superconductor-semiconductor hybrid devices
Author
Cahay, Marc
Author_Institution
Cincinnati Univ., OH, USA
Volume
12
Issue
4
fYear
1993
Firstpage
34
Lastpage
37
Abstract
The discovery of the cuprate superconducting materials, with critical temperatures exceeding 100 K, has revived interest in hybrid superconductor-semiconductor technology. An elementary definition of a superconductor is given, and superconducting field effect transistors (SuFETs) are presented. The effect of the close proximity of the source and drain electrodes on SuFETs is detailed, and the SuFET operation is explained using the theory of the superconducting proximity effect. Another approach employing an insulating material (such as SrTiO/sub 3/), using an external gate voltage to induce superconductivity at the surface, is described. New, designs of high-T/sub c/ superconductor-semiconductor heterostructures are discussed, including a three terminal resonant tunneling transistor (RTT) making use of high-T/sub c/ electrodes. A three-terminal MIS (metal-insulator-superconductor) device using an artificial angle grain boundary (AGB) junction is also discussed. Two types of flux flow transistors (FFTs) are described.<>
Keywords
field effect transistors; flux flow; high-temperature superconductors; proximity effect; resonant tunnelling devices; superconducting junction devices; SrTiO/sub 3/; YBaCuO; artificial angle grain boundary junction; cuprate superconducting materials; external gate voltage; flux flow transistors; high-T/sub c/ superconductor-semiconductor heterostructures; hybrid superconductor-semiconductor technology; induced surface superconductivity; source/drain electrode proximity; superconducting field effect transistors; superconducting proximity effect; three terminal resonant tunneling transistor; three-terminal metal-insulator-superconductor device; Electrodes; FETs; Insulation; Josephson junctions; Proximity effect; Superconducting devices; Superconducting materials; Superconductivity; Temperature; Voltage;
fLanguage
English
Journal_Title
Potentials, IEEE
Publisher
ieee
ISSN
0278-6648
Type
jour
DOI
10.1109/45.282340
Filename
282340
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