Title :
Effect of Random Circuit Fabrication Errors on Small-Signal Gain and Phase in Traveling-Wave Tubes
Author :
Pengvanich, Phongphaeth ; Chernin, David ; Lau, Y.Y. ; Luginsland, John W. ; Gilgenbach, Ronald M.
Author_Institution :
Univ. of Michigan, Ann Arbor
fDate :
3/1/2008 12:00:00 AM
Abstract :
Motivated by current interest in submillimeter and terahertz (THz) slow-wave vacuum electronic amplifiers, which employ miniature, difficult-to-manufacture slow-wave circuits, we evaluate the effects of small random fabrication errors on the small-signal characteristics of a traveling wave tube. The classical 1-D small-signal theory of Pierce, generalized to allow axially varying circuit characteristics, is applied. Random, axially varying perturbations are introduced in the circuit phase velocity mismatch , the gain parameter , and the cold-tube circuit loss , in Pierce notation. Results from a first-order perturbation analysis of the small-signal equations, which are confirmed by numerical analysis, show that the standard deviations in the output phase and in the small-signal gain are linearly proportional to the standard deviations of the individual perturbations in , , and . Our study confirms that the effects of perturbations in the circuit phase velocity dominate the effects of perturbations in and .
Keywords :
travelling wave amplifiers; travelling wave tubes; first-order perturbation analysis; random circuit fabrication error; slow-wave vacuum electronic amplifier; small-signal gain; traveling-wave tube; Broadband communication; Circuits; Electron beams; Electron tubes; Electronic warfare; Equations; Fabrication; Manufacturing processes; Numerical analysis; Radar; Manufacturing tolerance; statistical variation; traveling-wave tube (TWT);
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2007.914840