DocumentCode :
1079518
Title :
Laser annealing of low dose ion-implanted silicon and analysis by photoacoustic spectroscopy
Author :
McFarlane, R. ; Hess, Laura
Author_Institution :
Hughes Research Laboratories, Malibu, CA, USA
Volume :
15
Issue :
9
fYear :
1979
fDate :
9/1/1979 12:00:00 AM
Firstpage :
990
Lastpage :
991
Keywords :
Amorphous semiconductor materials/devices; Heat treatment; Laser applications, materials processing; Amorphous materials; Annealing; Backscatter; Chemical lasers; Crystallization; Gallium arsenide; Optical materials; Semiconductor lasers; Silicon; Spectroscopy;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1979.1070301
Filename :
1070301
Link To Document :
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