DocumentCode :
1079652
Title :
Characterization and Calibration of PILATUS Detectors
Author :
Kraft, P. ; Bergamaschi, A. ; Brönnimann, Ch ; Dinapoli, R. ; Eikenberry, E.F. ; Graafsma, H. ; Henrich, B. ; Johnson, I. ; Kobas, M. ; Mozzanica, A. ; Schlepütz, C.M. ; Schmitt, B.
Author_Institution :
Paul Scherrer Inst., Villigen
Volume :
56
Issue :
3
fYear :
2009
fDate :
6/1/2009 12:00:00 AM
Firstpage :
758
Lastpage :
764
Abstract :
Pilatus is a silicon hybrid pixel detector system for detecting X-rays in single photon counting mode. The PILATUS II chip, fabricated in a radiation tolerant design with a standard 0.25 mum CMOS process, was used to construct multichip modules with a size of 84 times 34 mm2 comprising 94´965 pixels. All calibrations and characterizations were carried out with monochromatic X-rays from a synchrotron source. In order to set any required threshold above the noise level between 2.14 keV and 22 keV the detector was calibrated with X-rays. An algorithm to adjust thresholds pixel-by-pixel and create trim files based on X-ray flat-field images was developed. The threshold dispersion was reduced from 343 eV to 36 eV by the means of trim files. An electronic noise of 447 eV has been measured. The PILATUS modules are suitable for various X-ray applications such as diffraction and imaging techniques.
Keywords :
CMOS integrated circuits; X-ray detection; calibration; nuclear electronics; photon counting; position sensitive particle detectors; semiconductor device noise; silicon radiation detectors; CMOS process; PILATUS detectors; X-ray detection; X-ray flat-field images; calibration; diffraction techniques; electronic noise; imaging techniques; monochromatic X-rays; multichip modules; radiation tolerant design; silicon hybrid pixel detector system; single photon counting mode; synchrotron source; CMOS process; Calibration; Multichip modules; Noise level; Noise measurement; Pixel; Silicon; Synchrotrons; X-ray detection; X-ray detectors; Hybrid pixel detector; single photon counting; threshold calibration; threshold dispersion; threshold trimming, noise;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2008.2009448
Filename :
5076066
Link To Document :
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