Characterization and Calibration of PILATUS Detectors

Author

Kraft, P. ; Bergamaschi, A. ; Brönnimann, Ch ; Dinapoli, R. ; Eikenberry, E.F. ; Graafsma, H. ; Henrich, B. ; Johnson, I. ; Kobas, M. ; Mozzanica, A. ; Schlepütz, C.M. ; Schmitt, B.

Author_Institution

Paul Scherrer Inst., Villigen

Volume

56

Issue

3

fYear

2009

fDate

6/1/2009 12:00:00 AM

Firstpage

758

Lastpage

764

Abstract

Pilatus is a silicon hybrid pixel detector system for detecting X-rays in single photon counting mode. The PILATUS II chip, fabricated in a radiation tolerant design with a standard 0.25 mum CMOS process, was used to construct multichip modules with a size of 84 times 34 mm² comprising 94´965 pixels. All calibrations and characterizations were carried out with monochromatic X-rays from a synchrotron source. In order to set any required threshold above the noise level between 2.14 keV and 22 keV the detector was calibrated with X-rays. An algorithm to adjust thresholds pixel-by-pixel and create trim files based on X-ray flat-field images was developed. The threshold dispersion was reduced from 343 eV to 36 eV by the means of trim files. An electronic noise of 447 eV has been measured. The PILATUS modules are suitable for various X-ray applications such as diffraction and imaging techniques.

Keywords

CMOS integrated circuits; X-ray detection; calibration; nuclear electronics; photon counting; position sensitive particle detectors; semiconductor device noise; silicon radiation detectors; CMOS process; PILATUS detectors; X-ray detection; X-ray flat-field images; calibration; diffraction techniques; electronic noise; imaging techniques; monochromatic X-rays; multichip modules; radiation tolerant design; silicon hybrid pixel detector system; single photon counting mode; synchrotron source; CMOS process; Calibration; Multichip modules; Noise level; Noise measurement; Pixel; Silicon; Synchrotrons; X-ray detection; X-ray detectors; Hybrid pixel detector; single photon counting; threshold calibration; threshold dispersion; threshold trimming, noise;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2008.2009448

Filename

5076066