Testing and diagnostics of CMOS circuits using light emission from off-state leakage current

Author

Stellari, Franco ; Song, Peilin ; Tsang, James C. ; McManus, Moyra K. ; Ketchen, Mark B.

Author_Institution

IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA

Volume

51

Issue

9

fYear

2004

Firstpage

1455

Lastpage

1462

Abstract

In recent years, innovative applications based on the detection of emission sources such as the light emission from off-state leakage current (LEOSLC) of CMOS transistors have been developed for testing and diagnosing modern ultralarge-scale integration circuits. In this paper, we show that LEOSLC can be used to effectively debug circuits, localize defects with a quick turn around time, read the logic state of gates, and extract the internal voltage drop of power distribution grids among others.

Keywords

CMOS integrated circuits; ULSI; integrated circuit testing; leakage currents; logic testing; transistors; CMOS circuits; CMOS transistors; LEOSLC; circuit debug; circuit diagnostics; circuit testing; emission sources; gates logic states; light emission; off-state leakage current; picosecond imaging circuit analysis; power distribution grids; ultralarge-scale integration circuits; voltage drop; Charge coupled devices; Circuit analysis; Circuit testing; Detectors; Leak detection; Leakage current; Logic gates; Optical imaging; Ultra large scale integration; Voltage; $I_DDQ$; PICA; off-state leakage current; picosecond imaging circuit analysis;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/TED.2004.833967

Filename

1325850