• DocumentCode
    1079893
  • Title

    Compact modeling of the noise of a bipolar transistor under DC and AC current crowding conditions

  • Author

    Paasschens, Jeroen C J

  • Author_Institution
    Philips Res. Labs., Eindhoven, Netherlands
  • Volume
    51
  • Issue
    9
  • fYear
    2004
  • Firstpage
    1483
  • Lastpage
    1495
  • Abstract
    The effect of current crowding on dc, on ac, and in particular on the noise characteristic of bipolar transistors, is studied. An equivalent circuit able to model these effects is presented. General formulations to calculate current crowding in arbitrary geometries are derived. Both rectangular and circular geometries are discussed in detail.
  • Keywords
    bipolar transistors; current density; equivalent circuits; semiconductor device breakdown; semiconductor device models; semiconductor device noise; AC current crowding conditions; DC current crowding conditions; analog simulation; bipolar transistor; compact modeling; equivalent circuit; noise characteristic; Bipolar transistors; Circuit noise; Circuit simulation; Equivalent circuits; Geometry; Noise figure; Noise measurement; Predictive models; Proximity effect; Radio frequency; Analog simulation; bipolar transistors; current crowding; equivalent circuits; noise; spice;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2004.833580
  • Filename
    1325854