DocumentCode :
1080372
Title :
Analysis of minority-carrier transport in polysilicon devices
Author :
Fossum, Jerry G. ; Sundaresan, Ravishankar
Author_Institution :
University of Florida, Gainesville, FL
Volume :
29
Issue :
8
fYear :
1982
fDate :
8/1/1982 12:00:00 AM
Firstpage :
1185
Lastpage :
1197
Abstract :
Key assumptions are made, with justification, to simplify the three-dimensional, nonlinear boundary-value problem that defines minority-carrier transport, including recombination, in polysilicon devices. These assumptions enable the separation of the grain-boundary recombination analysis, which is based on quasi-equilibrium in the space-charge region, from the intragrain transport analysis, which is done by partitioning the grain into subregions in which the minority-carrier flow is predominantly one-dimensional. The analyses are coupled through the effective minority-carrier recombination velocity at the grain boundary, which generally is dependent on the minority-carrier density in the quasi-neutral grain. Limitations of the model implied by the quasi-equilibrium assumption are effectively removed by recognizing that when conditions obtain that negate quasi-equilibrium, the effective recombination velocity is fixed at the minority-carrier kinetic-limit velocity. The model development is facilitated by computer-aided numerical analysis of the grain-boundary recombination and is supported by qualitative discussion of the underlying physics.
Keywords :
Boundary conditions; Electrons; Grain boundaries; Helium; Photovoltaic cells; Physics computing; Radiative recombination; Spontaneous emission; Surface morphology; Transistors;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1982.20855
Filename :
1482352
Link To Document :
بازگشت