DocumentCode :
1080496
Title :
Feed forward due to barrier modulation in charge-coupled devices
Author :
Madan, Sudhir K. ; Mathur, Bimal ; Vasi, J.
Author_Institution :
Indian Institute of Technology, Delhi, India
Volume :
29
Issue :
8
fYear :
1982
fDate :
8/1/1982 12:00:00 AM
Firstpage :
1269
Lastpage :
1276
Abstract :
A new type of signal degradation, namely feed forward, is shown to exist in charge-coupled devices. This arises because of barrier modulation due to signal charge and the presence of surface states. Feed forward results in a pulse coming out earlier than the main signal pulse. The magnitude of the feed forward pulse was found to be as high as 0.5 percent of the signal charge for a 24½ bit, CCD delay line. Computer calculations have been performed to quantify the effect for the structure. Results obtained with a special clock for different clocking parameters have been explained, based on the existing model of emission of charge from the surface states.
Keywords :
Charge coupled devices; Charge transfer; Clocks; Degradation; Delay lines; Digital integrated circuits; Feeds; Integrated circuit technology; Interface states; Physics;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1982.20866
Filename :
1482363
Link To Document :
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