DocumentCode
1080640
Title
The concept of generation and recombination lifetimes in semiconductors
Author
Chroder, D.K.
Author_Institution
Arizona State University, Tempe, AZ
Volume
29
Issue
8
fYear
1982
fDate
8/1/1982 12:00:00 AM
Firstpage
1336
Lastpage
1338
Abstract
The purpose of this brief is to discuss the concept of generation and recombination lifetimes, a concept frequently confused in the literature. The regimes of device operation where they apply is discussed and it is shown experimentally for the first time that the two can be very different in magnitude.
Keywords
Charge carrier density; Charge carrier processes; Gallium arsenide; Lifetime estimation; Measurement techniques; Optical computing; P-n junctions; Photonic band gap; Radiative recombination; Spontaneous emission;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1982.20879
Filename
1482376
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