Title :
Strained GaxIn1-xP/(AlGa)0.5In0.5P heterostructures and quantum-well laser diodes
Author :
Bour, D.P. ; Geels, R.S. ; Treat, D.W. ; Paoli, T.L. ; Ponce, F. ; Thornton, R.L. ; Krusor, B.S. ; Bringans, R.D. ; Welch, D.F.
Author_Institution :
Xerox Palo Alto Res. Center, CA, USA
fDate :
2/1/1994 12:00:00 AM
Abstract :
The properties of (AlGa)0.5In0.5P, strained GaxIn1-xP/(AlGa)0.5In0.5P heterostructures, and single quantum well (QW) laser diodes with Al0.5In0.5P cladding layers, prepared by low pressure organometallic vapor phase epitaxy, are described. The influence of biaxial strain upon the relative positions of the valence band edges are examined by analyzing the polarized spontaneous emission. Laser diodes with wavelength 620<λ<690 nm are also fabricated, using active regions of biaxially strained GaInP or AlGaInP. At longer wavelengths, threshold current densities under 200 A/cm2 and efficiencies greater than 80% result from a biaxially-compressed GaInP QW active region. Short wavelength AlGaInP laser performance is hindered by the poor electron confinement afforded by AlGaInP heterostructures. Despite the electron leakage problem, good 630-nm band performance, and extension into the 620-nm band, is achieved with strained, single QW active regions
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; semiconductor growth; semiconductor lasers; valence bands; vapour phase epitaxial growth; (AlGa)0.5In0.5P; 620 to 690 nm; 80 percent; Al0.5In0.5P cladding layers; GaInP-(AlGa)0.5In0.5P; biaxial strain; electron confinement; electron leakage; low pressure organometallic vapor phase epitaxy; polarized spontaneous emission; single quantum well laser diodes; strained GaxIn1-xP/(AlGa)0.5In 0.5P heterostructures; threshold current densities; valence band edges; Capacitive sensors; DH-HEMTs; Diode lasers; Doping; Electrons; Epitaxial growth; Optical pumping; Photonic band gap; Polarization; Quantum well lasers; Spontaneous emission; Threshold current; Zinc;
Journal_Title :
Quantum Electronics, IEEE Journal of