• DocumentCode
    108116
  • Title

    Aging Effect and Induced Electric Phenomena on Dielectric Materials Irradiated With High Energy Electrons

  • Author

    Paulmier, T. ; Hanna, Rachelle ; Belhaj, M. ; Dirassen, B. ; Payan, Denis ; Balcon, Nicolas ; Tonon, Claire ; Dantras, Eric ; Bernes, Alain

  • Author_Institution
    Office Nat. d´Etudes et de Rech. Aerospatiales, French Aerosp. Lab., Toulouse, France
  • Volume
    41
  • Issue
    12
  • fYear
    2013
  • fDate
    Dec. 2013
  • Firstpage
    3422
  • Lastpage
    3428
  • Abstract
    The high radiation dose received by space used polymers may greatly alter their electric properties. This effect could, for instance, reduce significantly radiation-induced conductivity (RIC) leading to high charging risks that were not predicted from pristine sample. For an optimized qualification and prediction, it is therefore highly important to characterize the charging properties of polymers and their evolution as a function of the received dose. This paper aimed at studying aging of electric properties of four different polymers (Teflon FEP, Kapton, polyepoxy DP 490 adhesive, and silicon QS1123 adhesive) at high dose level (105 and 106 Gy). We have been able to demonstrate that aging could lead to the reduction of RIC on some polymers (for polyepoxy and silicone adhesives, and FEP) or inversely to the increase of RIC on others (e.g., Kapton). Ionization effect must, however, be considered in the analysis of the results. Relaxation processes could drastically affect the charging profile and macroscopic electric properties.
  • Keywords
    aerospace materials; ageing; electron beam effects; polymers; Kapton; Teflon FEP; aging effect; dielectric material; high energy electrons; induced electric phenomena; polyepoxy DP 490 adhesive; polymers; radiation induced onductivity; relaxation processes; silicon QS1123 adhesive; Aging; Charge carrier processes; Conductivity; Electron beams; Plastics; Radiation effects; Aging; dielectric materials; electron radiation effects; materials reliability; space technology;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2013.2279302
  • Filename
    6588584