DocumentCode
108116
Title
Aging Effect and Induced Electric Phenomena on Dielectric Materials Irradiated With High Energy Electrons
Author
Paulmier, T. ; Hanna, Rachelle ; Belhaj, M. ; Dirassen, B. ; Payan, Denis ; Balcon, Nicolas ; Tonon, Claire ; Dantras, Eric ; Bernes, Alain
Author_Institution
Office Nat. d´Etudes et de Rech. Aerospatiales, French Aerosp. Lab., Toulouse, France
Volume
41
Issue
12
fYear
2013
fDate
Dec. 2013
Firstpage
3422
Lastpage
3428
Abstract
The high radiation dose received by space used polymers may greatly alter their electric properties. This effect could, for instance, reduce significantly radiation-induced conductivity (RIC) leading to high charging risks that were not predicted from pristine sample. For an optimized qualification and prediction, it is therefore highly important to characterize the charging properties of polymers and their evolution as a function of the received dose. This paper aimed at studying aging of electric properties of four different polymers (Teflon FEP, Kapton, polyepoxy DP 490 adhesive, and silicon QS1123 adhesive) at high dose level (105 and 106 Gy). We have been able to demonstrate that aging could lead to the reduction of RIC on some polymers (for polyepoxy and silicone adhesives, and FEP) or inversely to the increase of RIC on others (e.g., Kapton). Ionization effect must, however, be considered in the analysis of the results. Relaxation processes could drastically affect the charging profile and macroscopic electric properties.
Keywords
aerospace materials; ageing; electron beam effects; polymers; Kapton; Teflon FEP; aging effect; dielectric material; high energy electrons; induced electric phenomena; polyepoxy DP 490 adhesive; polymers; radiation induced onductivity; relaxation processes; silicon QS1123 adhesive; Aging; Charge carrier processes; Conductivity; Electron beams; Plastics; Radiation effects; Aging; dielectric materials; electron radiation effects; materials reliability; space technology;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2013.2279302
Filename
6588584
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