DocumentCode :
108116
Title :
Aging Effect and Induced Electric Phenomena on Dielectric Materials Irradiated With High Energy Electrons
Author :
Paulmier, T. ; Hanna, Rachelle ; Belhaj, M. ; Dirassen, B. ; Payan, Denis ; Balcon, Nicolas ; Tonon, Claire ; Dantras, Eric ; Bernes, Alain
Author_Institution :
Office Nat. d´Etudes et de Rech. Aerospatiales, French Aerosp. Lab., Toulouse, France
Volume :
41
Issue :
12
fYear :
2013
fDate :
Dec. 2013
Firstpage :
3422
Lastpage :
3428
Abstract :
The high radiation dose received by space used polymers may greatly alter their electric properties. This effect could, for instance, reduce significantly radiation-induced conductivity (RIC) leading to high charging risks that were not predicted from pristine sample. For an optimized qualification and prediction, it is therefore highly important to characterize the charging properties of polymers and their evolution as a function of the received dose. This paper aimed at studying aging of electric properties of four different polymers (Teflon FEP, Kapton, polyepoxy DP 490 adhesive, and silicon QS1123 adhesive) at high dose level (105 and 106 Gy). We have been able to demonstrate that aging could lead to the reduction of RIC on some polymers (for polyepoxy and silicone adhesives, and FEP) or inversely to the increase of RIC on others (e.g., Kapton). Ionization effect must, however, be considered in the analysis of the results. Relaxation processes could drastically affect the charging profile and macroscopic electric properties.
Keywords :
aerospace materials; ageing; electron beam effects; polymers; Kapton; Teflon FEP; aging effect; dielectric material; high energy electrons; induced electric phenomena; polyepoxy DP 490 adhesive; polymers; radiation induced onductivity; relaxation processes; silicon QS1123 adhesive; Aging; Charge carrier processes; Conductivity; Electron beams; Plastics; Radiation effects; Aging; dielectric materials; electron radiation effects; materials reliability; space technology;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2013.2279302
Filename :
6588584
Link To Document :
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