DocumentCode
1081179
Title
Minority current in the base region of bipolar transistors under high-level injection conditions
Author
Rofail, Samir S.
Author_Institution
University of Petroleum and Minerals, Dhahran, Saudi Arabia
Volume
29
Issue
10
fYear
1982
fDate
10/1/1982 12:00:00 AM
Firstpage
1634
Lastpage
1637
Abstract
A simple expression is derived for the electron current in the base region of n-p-n bipolar structures under high-level injection conditions. Comparison between the predicted results and those obtained from an exact computer simulation is presented. The expression for Jn is related to the Gummel equation [1] and is in a form particularly suited to use with partitioned device models. It is restricted, however, to cases where the impurity charge in the base is approximately constant, an approximation that will be examined.
Keywords
Bipolar transistors; Capacitance; Data analysis; FETs; Noise generators; Noise measurement; Predictive models; Temperature; Testing; Transconductance;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1982.20928
Filename
1482425
Link To Document