• DocumentCode
    1081179
  • Title

    Minority current in the base region of bipolar transistors under high-level injection conditions

  • Author

    Rofail, Samir S.

  • Author_Institution
    University of Petroleum and Minerals, Dhahran, Saudi Arabia
  • Volume
    29
  • Issue
    10
  • fYear
    1982
  • fDate
    10/1/1982 12:00:00 AM
  • Firstpage
    1634
  • Lastpage
    1637
  • Abstract
    A simple expression is derived for the electron current in the base region of n-p-n bipolar structures under high-level injection conditions. Comparison between the predicted results and those obtained from an exact computer simulation is presented. The expression for Jnis related to the Gummel equation [1] and is in a form particularly suited to use with partitioned device models. It is restricted, however, to cases where the impurity charge in the base is approximately constant, an approximation that will be examined.
  • Keywords
    Bipolar transistors; Capacitance; Data analysis; FETs; Noise generators; Noise measurement; Predictive models; Temperature; Testing; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1982.20928
  • Filename
    1482425