DocumentCode :
1081179
Title :
Minority current in the base region of bipolar transistors under high-level injection conditions
Author :
Rofail, Samir S.
Author_Institution :
University of Petroleum and Minerals, Dhahran, Saudi Arabia
Volume :
29
Issue :
10
fYear :
1982
fDate :
10/1/1982 12:00:00 AM
Firstpage :
1634
Lastpage :
1637
Abstract :
A simple expression is derived for the electron current in the base region of n-p-n bipolar structures under high-level injection conditions. Comparison between the predicted results and those obtained from an exact computer simulation is presented. The expression for Jnis related to the Gummel equation [1] and is in a form particularly suited to use with partitioned device models. It is restricted, however, to cases where the impurity charge in the base is approximately constant, an approximation that will be examined.
Keywords :
Bipolar transistors; Capacitance; Data analysis; FETs; Noise generators; Noise measurement; Predictive models; Temperature; Testing; Transconductance;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1982.20928
Filename :
1482425
Link To Document :
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