Title :
IIA-9 1/2 µm Si MESFET logic devices
Author :
Nulman, J. ; Faricelli, J. ; Krusius, P.
Author_Institution :
Cornell University, Ithaca, NY
fDate :
10/1/1982 12:00:00 AM
Keywords :
Analytical models; Contracts; Electric variables measurement; Force measurement; Geometry; Laboratories; Logic devices; MESFETs; Solid modeling; Very high speed integrated circuits;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1982.20944
