DocumentCode
1081393
Title
Current-voltage characteristics of bend in mesoscopic wire
Author
Thornton, Trevor J. ; Yamada, Shigeru ; Yamamoto, Manabu ; Aihara, Kazuyuki
Author_Institution
NTT Basic Res. Labs., Tokyo, Japan
Volume
27
Issue
13
fYear
1991
fDate
6/20/1991 12:00:00 AM
Firstpage
1177
Lastpage
1178
Abstract
The four terminal resistance of a bend in a mesoscopic wire changes sign with increasing temperature. This transition leads to a nonlinear I/V characteristic which can, under suitable bias conditions, be used to produce frequency doubling.
Keywords
carrier mobility; negative resistance; quantum interference phenomena; semiconductor quantum wires; ballistic wire junction; bend resistance; bias conditions; crossed wire junction; four terminal resistance; frequency doubling; mesoscopic wire; nonlinear I/V characteristic; temperature dependence;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19910734
Filename
132736
Link To Document