Title :
IIB-9 multiplication noise in
Author :
Osaka, F. ; Kaneda, Tadahiro ; Nakajima, Kensuke
fDate :
10/1/1982 12:00:00 AM
Keywords :
Dark current; Diodes; Epitaxial growth; Etching; Indium phosphide; Ionization; Photoconductivity; Signal to noise ratio; Substrates; Surfaces;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1982.20952
