DocumentCode
1081487
Title
Estimation of classifier performance
Author
Fukunaga, Keinosuke ; Hayes, Raymond R.
Author_Institution
Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
Volume
11
Issue
10
fYear
1989
fDate
10/1/1989 12:00:00 AM
Firstpage
1087
Lastpage
1101
Abstract
An expression for expected classifier performance previously derived by the authors (ibid., vol.11, no.8, p.873-855, Aug. 1989) is applied to a variety of error estimation methods and a unified and comprehensive approach to the analysis of classifier performance is presented. After the error expression is introduced, it is applied to three cases: (1) a given classifier and a finite test set; (2) given test distributions a finite design set; and (3) finite and independent design and test sets. For all cases, the expected values and variances of the classifier errors are presented. Although the study of Case 1 does not produce any new results, it is important to confirm that the proposed approach produces the known results, and also to show how these results are modified when the design set becomes finite, as in Cases 2 and 3. The error expression is used to compute the bias between the leave-one-out and resubstitution errors for quadratic classifiers. The effect of outliers in design samples on the classification error is discussed. Finally, the theoretical analysis of the bootstrap method is presented for quadratic classifiers
Keywords
error analysis; estimation theory; pattern recognition; classifier; error estimation; error expression; finite test set; pattern recognition; performance analysis; Catalogs; Design methodology; Design optimization; Distributed computing; Genetic expression; Guidelines; Milling machines; Pattern recognition; Process design; Testing;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/34.42839
Filename
42839
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