• DocumentCode
    1081487
  • Title

    Estimation of classifier performance

  • Author

    Fukunaga, Keinosuke ; Hayes, Raymond R.

  • Author_Institution
    Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    11
  • Issue
    10
  • fYear
    1989
  • fDate
    10/1/1989 12:00:00 AM
  • Firstpage
    1087
  • Lastpage
    1101
  • Abstract
    An expression for expected classifier performance previously derived by the authors (ibid., vol.11, no.8, p.873-855, Aug. 1989) is applied to a variety of error estimation methods and a unified and comprehensive approach to the analysis of classifier performance is presented. After the error expression is introduced, it is applied to three cases: (1) a given classifier and a finite test set; (2) given test distributions a finite design set; and (3) finite and independent design and test sets. For all cases, the expected values and variances of the classifier errors are presented. Although the study of Case 1 does not produce any new results, it is important to confirm that the proposed approach produces the known results, and also to show how these results are modified when the design set becomes finite, as in Cases 2 and 3. The error expression is used to compute the bias between the leave-one-out and resubstitution errors for quadratic classifiers. The effect of outliers in design samples on the classification error is discussed. Finally, the theoretical analysis of the bootstrap method is presented for quadratic classifiers
  • Keywords
    error analysis; estimation theory; pattern recognition; classifier; error estimation; error expression; finite test set; pattern recognition; performance analysis; Catalogs; Design methodology; Design optimization; Distributed computing; Genetic expression; Guidelines; Milling machines; Pattern recognition; Process design; Testing;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.42839
  • Filename
    42839