Title :
IIIB-6 high performance bipolar transistors in a CMOS process
Author :
Sullivan, Philip
fDate :
10/1/1982 12:00:00 AM
Keywords :
Bipolar transistors; CMOS process; Circuits; Contact resistance; Implants; Microelectronics; Read-write memory; Silicon; Substrates; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1982.20965
