DocumentCode
1081949
Title
VIA-3 measurement of interface trapped charge in short-channel MOSFETs
Author
Russell, T.J. ; Wilson, C.L. ; Gaitan, M.
Volume
29
Issue
10
fYear
1982
fDate
10/1/1982 12:00:00 AM
Firstpage
1702
Lastpage
1702
Keywords
Avalanche breakdown; Charge measurement; Charge pumps; Circuits; Current measurement; Electric breakdown; MOS capacitors; MOSFETs; Pollution measurement; Subthreshold current;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1982.20999
Filename
1482496
Link To Document