• DocumentCode
    1081976
  • Title

    Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor

  • Author

    Balakrishnan, Kedarnath J. ; Giles, Grady ; Wingfield, James

  • Volume
    26
  • Issue
    1
  • fYear
    2009
  • Firstpage
    52
  • Lastpage
    59
  • Abstract
    Multicore microprocessors provide a natural application environment for IEEE Std 1500 and, as this article proves, allow for innovative approaches that capitalize on the fact that the various cores are identical.
  • Keywords
    IEEE standards; integrated circuit testing; microprocessor chips; IEEE Std 1500; multicore microprocessors; quad-core AMD opteron microprocessor; test access mechanism; Bandwidth; Broadcasting; Circuit testing; Fault detection; Job shop scheduling; Laser mode locking; Manufacturing; Microprocessors; Multicore processing; Pins; SoC testing; embedded-core testing; microprocessor testing; quad-core AMD microprocessor; test access mechanism; test compression;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2009.17
  • Filename
    4760116
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1081976