DocumentCode
1081983
Title
VIA-9 Auger recombination study in silicon using a tunneling technique
Author
Krieger, Gerhard ; Swanson, Richard M.
Volume
29
Issue
10
fYear
1982
fDate
10/1/1982 12:00:00 AM
Firstpage
1705
Lastpage
1705
Keywords
Charge carrier processes; Current measurement; Doping; Electron traps; Heterojunctions; Laboratories; Silicon; Spontaneous emission; Substrate hot electron injection; Tunneling;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1982.21002
Filename
1482499
Link To Document