DocumentCode
1081999
Title
Effect of temperature on in-use stiction of cantilever beams coated with perfluorinated alkysiloxane monolayers
Author
Fréchette, Joëlle ; Maboudian, Roya ; Carraro, Carlo
Author_Institution
Dept. of Chem. Eng., California Univ., Berkeley, CA
Volume
15
Issue
4
fYear
2006
Firstpage
737
Lastpage
744
Abstract
The effect of annealing (for temperatures up to 300 degC) on the antistiction performance of perfluorinated self-assembled monolayers (SAMs) is characterized using polycrystalline Si cantilever beam arrays. The monolayers 1H,1H,2H,2H, perfluorodecyltrichlorosilane (FDTS) and 1H,1H,2H,2H, perfluorodecyldimethylchlorosilane (FDDMCS) deposited from both liquid and vapor phase are investigated. It is observed that stiction decreases upon annealing for both monolayers and for both types of deposition. FDTS, however, displays greater temperature stability than FDDMCS regardless of the mode of deposition. The higher thermal resistance of the FDTS underscores the importance of monolayer crosslinking since unlike FDDMCS, FDTS forms a siloxane network on the surface. Further vacuum annealing and X-ray photoelectron spectroscopy experiments are performed to identify chemical changes in the monolayer during annealing. Incipient monolayer degradation is observed, with loss of the whole fluorinated monolayer chain. This process appears drastically different from the decomposition mechanism of hydrogenated alkylsiloxane monolayers such as octadecyltrichlorosilane (OTS)
Keywords
annealing; cantilevers; liquid phase deposited coatings; micromachining; monolayers; self-assembly; silicon; stiction; vapour deposited coatings; Si; X-ray photoelectron spectroscopy experiments; antistiction performance; cantilever beam arrays; cantilever beams; fluorinated monolayer chain; hydrogenated alkylsiloxane monolayers; in-use stiction; liquid phase deposition; microelectromechanical systems; monolayer coating; monolayer degradation; octadecyltrichlorosilane; perfluorinated alkysiloxane monolayers; perfluorodecyldimethylchlorosilane; perfluorodecyltrichlorosilane; polycrystalline silicon; self-assembled monolayers; temperature effect; temperature stability; thermal resistance; vacuum annealing; vapor phase deposition; Annealing; Chemicals; Displays; Spectroscopy; Stability; Structural beams; Surface resistance; Temperature; Thermal degradation; Thermal resistance; Microelectromechanical systems (MEMS); monolayer coating; stiction; thermal stability;
fLanguage
English
Journal_Title
Microelectromechanical Systems, Journal of
Publisher
ieee
ISSN
1057-7157
Type
jour
DOI
10.1109/JMEMS.2006.878893
Filename
1668168
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