Title :
VIB-3 permeable base transistor - A new technology
Author :
Mishra, Umesh ; Kohn, Erhard ; Kawai, N.J. ; Eastman, L.F.
fDate :
10/1/1982 12:00:00 AM
Keywords :
Electrical resistance measurement; Fingers; Frequency measurement; Gain measurement; Gallium arsenide; Laboratories; Millimeter wave technology; Noise figure; Q measurement; Tungsten;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1982.21006
