Direct index measurements of diffused channel waveguides

A nondestructive method is described for obtaining information about the refractive index profiles of diffused channel waveguides of the type used in integrated optics. The method assumes that the index profile can be approximated as a product of two functions each of which depends on one of the two transverse coordinates. By observing the focusing effect, which the waveguide has on collimated light passing through it transversely to its axis, the shape of the index profile in a direction parallel to the surface of the substrate can be obtained. From measurements of the reflection coefficients we obtain the refractive index at the upper surface of the waveguide. By combining the two measurements the effective depth of the waveguide can be calculated. Results of measurements on multimode and single-mode waveguides formed in glass and lithium niobate are presented.