DocumentCode :
1082328
Title :
Photometric Stereo via Expectation Maximization
Author :
Wu, Tai-Pang ; Tang, Chi-Keung
Author_Institution :
Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
Volume :
32
Issue :
3
fYear :
2010
fDate :
3/1/2010 12:00:00 AM
Firstpage :
546
Lastpage :
560
Abstract :
This paper presents a robust and automatic approach to photometric stereo, where the two main components, namely surface normals and visible surfaces, are respectively optimized by expectation maximization (EM). A dense set of input images is conveniently captured using a digital video camera while a handheld spotlight is being moved around the target object and a small mirror sphere. In our approach, the inherently complex optimization problem is simplified into a two-step optimization, where EM is employed in each step: 1) Using the dense input, the weight or importance of each observation is alternately optimized with the normal and albedo at each pixel and 2) using the optimized normals and employing the Markov random fields (MRFs), surface integrabilities and discontinuities are alternately optimized in visible surface reconstruction. Our mathematical derivation gives simple updating rules for the EM algorithms, leading to a stable, practical, and parameter-free implementation that is very robust even in the presence of complex geometry, shadows, highlight, and transparency. We present high-quality results on normal and visible surface reconstruction, where fine geometric details are automatically recovered by our method.
Keywords :
Markov processes; expectation-maximisation algorithm; image reconstruction; photometry; stereo image processing; EM algorithm; Markov random fields; digital video camera; expectation maximization; mathematical derivation; photometric stereo; surface discontinuities; surface integrabilities; surface normals; surface reconstruction; two-step optimization; visible surface; Photometric stereo; albedo and visible surface reconstruction.; expectation maximization; normal;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2009.15
Filename :
4760144
Link To Document :
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