DocumentCode
1082328
Title
Photometric Stereo via Expectation Maximization
Author
Wu, Tai-Pang ; Tang, Chi-Keung
Author_Institution
Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
Volume
32
Issue
3
fYear
2010
fDate
3/1/2010 12:00:00 AM
Firstpage
546
Lastpage
560
Abstract
This paper presents a robust and automatic approach to photometric stereo, where the two main components, namely surface normals and visible surfaces, are respectively optimized by expectation maximization (EM). A dense set of input images is conveniently captured using a digital video camera while a handheld spotlight is being moved around the target object and a small mirror sphere. In our approach, the inherently complex optimization problem is simplified into a two-step optimization, where EM is employed in each step: 1) Using the dense input, the weight or importance of each observation is alternately optimized with the normal and albedo at each pixel and 2) using the optimized normals and employing the Markov random fields (MRFs), surface integrabilities and discontinuities are alternately optimized in visible surface reconstruction. Our mathematical derivation gives simple updating rules for the EM algorithms, leading to a stable, practical, and parameter-free implementation that is very robust even in the presence of complex geometry, shadows, highlight, and transparency. We present high-quality results on normal and visible surface reconstruction, where fine geometric details are automatically recovered by our method.
Keywords
Markov processes; expectation-maximisation algorithm; image reconstruction; photometry; stereo image processing; EM algorithm; Markov random fields; digital video camera; expectation maximization; mathematical derivation; photometric stereo; surface discontinuities; surface integrabilities; surface normals; surface reconstruction; two-step optimization; visible surface; Photometric stereo; albedo and visible surface reconstruction.; expectation maximization; normal;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2009.15
Filename
4760144
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