• DocumentCode
    1082624
  • Title

    Development of self-pulsations due to self-annealing of proton bombarded regions during aging in proton bombarded stripe-geometry AlGaAs DH lasers grown by molecular beam epitaxy

  • Author

    Schorr, Anthony J. ; Tsang, W.T.

  • Author_Institution
    Western Electric Company, Reading, PA, USA
  • Volume
    16
  • Issue
    8
  • fYear
    1980
  • fDate
    8/1/1980 12:00:00 AM
  • Firstpage
    898
  • Lastpage
    901
  • Abstract
    Experimental observations indicate that the occurrence of optical self-pulsation in proton delineated stripe-geometry double-heterostructure junction lasers is related to the degree of gain guiding inherent in individual lasers. We show that an aging process occurs during lasing operation which has the effect of partially annealing the proton induced carrier removal concentration at the edges of the active stripe of the laser. In some lasers, the magnitude of this annealing effect is sufficiently large to flatten the active stripe carrier concentration profile thus reducing filament stability leading ultimately to optical self-pulsation. It is shown that the carrier concentration profile modification is due to the dual effects of decreasing the n = 2 nonradiative current component at the active stripe-proton bombarded interface as well as the geometric effect of increasing the laser active stripe width. This latter effect may be also responsible for some portion of laser threshold current increase observed during device operation.
  • Keywords
    Gallium materials/lasers; Laser thermal factors; Proton radiation effects; Pulsed lasers; Semiconductor device radiation effects; Semiconductor device reliability; Semiconductor device thermal factors; Aging; Annealing; DH-HEMTs; Degradation; Geometrical optics; Laser stability; Laser theory; Molecular beam epitaxial growth; Optical transmitters; Protons;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1980.1070586
  • Filename
    1070586