• DocumentCode
    1082670
  • Title

    Time-Wavelength Reflectance Maps of Photonic Crystal Waveguides: A New View on Disorder-Induced Scattering

  • Author

    Parini, Alberto ; Hamel, Philippe ; De Rossi, Alfredo ; Combrié, Sylvain ; Tran, Nguyen-Vi-Quynh ; Gottesman, Yaneck ; Gabet, Renaud ; Talneau, Anne ; Jaouën, Yves ; Vadalà, Giovanni

  • Author_Institution
    TELECOM SudParis, Evry, France
  • Volume
    26
  • Issue
    23
  • fYear
    2008
  • Firstpage
    3794
  • Lastpage
    3802
  • Abstract
    We investigate the impact of disorder on the propagation of photonic crystal waveguide modes using phase-sensitive optical low-coherence reflectometry.Combined with a suitable numerical processing, this technique reveals a considerable amount of information that we cast as time-wavelength reflectance maps. By comparing measurements on different samples, we easily identify inter-mode scattering and propagation losses mediated by slow leaky modes. We also characterize the dispersive behaviour of point defects. Our results verify previous theoretical predictions about the general group velocity scaling of losses and the dominant role of backscattering.
  • Keywords
    backscatter; light scattering; optical dispersion; optical losses; optical materials; optical testing; optical waveguides; photonic crystals; point defects; reflectometry; backscattering; disorder-induced scattering; group velocity dispersion; group velocity scaling; optical inter-mode scattering; phase-sensitive optical low-coherence reflectometry; photonic crystal waveguide modes; point defects; propagation losses; slow leaky modes; time-wavelength reflectance map; Dispersion; Electromagnetic scattering; Loss measurement; Optical propagation; Optical scattering; Optical waveguides; Particle scattering; Photonic crystals; Propagation losses; Reflectivity; Disorder; optical low-coherence reflectometry (OLCR); photonic crystal; slow light;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2008.2004957
  • Filename
    4760201