Title :
Ultrafast deep UV Lithography with excimer lasers
Author :
Jain, K. ; Willson, C.G. ; Lin, B.J.
Author_Institution :
IBM Research Laboratory, San Jose, CA
fDate :
3/1/1982 12:00:00 AM
Abstract :
The use of high-power pulsed excimer lasers for photolithography is described for the first time. Short exposure times, high resolution and absence of speckle are experimentally demonstrated. Using a XeCl laser at 308 nm and a KrF laser at 248 nm, excellent quality images are obtained by contact printing in two positive photoresists. Resolution down to 1000 line-pairs/mm is demonstrated. These images are comparable to state-of-the-art lithography done with conventional lamps; the major difference is that the excimer laser technique is ∼ 2 orders of magnitude faster. Preliminary results on reciprocity behavior in several resists are also presented.
Keywords :
Adaptive optics; Lamps; Laser beams; Laser modes; Lithography; Optical pulses; Power lasers; Resists; Spatial coherence; Speckle;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1982.25476