DocumentCode
1083076
Title
The hydrogenated amorphous silicon active hollow four quadrant orientation detector for application to neural network image sensors
Author
Lin, Kang-Chen ; Sah, Wen-Jyh ; Lee, Si-Chen
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume
41
Issue
5
fYear
1994
fDate
5/1/1994 12:00:00 AM
Firstpage
666
Lastpage
670
Abstract
The fundamental way to improve the processing speed of pattern recognition is to implement the data processing function by hardware circuits. A simple integrated device by combining hollow four quadrant orientation detector (hollow FOQUOD) with an amorphous silicon thin film transistor as a switch element has been successfully fabricated. This device is called active hollow FOQUOD. The hollow FOQUOD detector can extract the edge position and its orientation from an object image with a precision of 5° which is consistent with the theoretical simulation. It is demonstrated that the thin film transistor can indeed switch the hollow FOQUOD detector on and off and avoid the crosstalk problem when used in a 3×3 two-dimensional array
Keywords
amorphous semiconductors; edge detection; elemental semiconductors; image sensors; neural nets; pattern recognition equipment; silicon; thin film transistors; 3×3 two-dimensional array; Si:H; active hollow FOQUOD; amorphous Si thin film transistor; crosstalk problem; data processing function; edge position; hardware circuits; hollow FOQUOD; hollow FOQUOD detector; hydrogenated amorphous silicon active hollow four quadrant orientation detector; integrated device; neural network image sensors; object image; orientation; pattern recognition; processing speed; switch element; Amorphous silicon; Circuits; Data processing; Detectors; Hardware; Image edge detection; Object detection; Pattern recognition; Switches; Thin film transistors;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.285014
Filename
285014
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