• DocumentCode
    1083306
  • Title

    Pulsed laser-induced damage to thin-film optical coatings - Part II: Theory

  • Author

    Walker, Thomas W. ; Guenther, Arthur H. ; Nielsen, Philip

  • Author_Institution
    Air Force Weapons Laboratory, Kirtland Air Force Base, NM, USA
  • Volume
    17
  • Issue
    10
  • fYear
    1981
  • fDate
    10/1/1981 12:00:00 AM
  • Firstpage
    2053
  • Lastpage
    2065
  • Abstract
    In this paper the theories of avalanche ionization, multiphoton absorption, and impurity-initiated laser-induced damage are treated. At first inspection, none of these theories adequately describe the experimental observations of the variation of pulsed laser damage threshold in optical thin films with changes in material property, laser wavelength, pulse length, or film thickness. However, it is shown that the inclusion of a Mie absorption cross section for a range of dielectric impurity sizes provides a good description of the database with the impurity model. It is also shown that the thermal properties of the host film material and impurity are of considerable importance in explaining observed experimental data.
  • Keywords
    Charge carrier processes; Coatings; Dielectric films; Dielectric radiation effects; Laser radiation effects; Optical materials/devices; Pulsed lasers; Absorption; Dielectric thin films; Impurities; Inspection; Ionization; Laser modes; Laser theory; Laser transitions; Optical films; Optical pulses;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1981.1070650
  • Filename
    1070650