DocumentCode
1083306
Title
Pulsed laser-induced damage to thin-film optical coatings - Part II: Theory
Author
Walker, Thomas W. ; Guenther, Arthur H. ; Nielsen, Philip
Author_Institution
Air Force Weapons Laboratory, Kirtland Air Force Base, NM, USA
Volume
17
Issue
10
fYear
1981
fDate
10/1/1981 12:00:00 AM
Firstpage
2053
Lastpage
2065
Abstract
In this paper the theories of avalanche ionization, multiphoton absorption, and impurity-initiated laser-induced damage are treated. At first inspection, none of these theories adequately describe the experimental observations of the variation of pulsed laser damage threshold in optical thin films with changes in material property, laser wavelength, pulse length, or film thickness. However, it is shown that the inclusion of a Mie absorption cross section for a range of dielectric impurity sizes provides a good description of the database with the impurity model. It is also shown that the thermal properties of the host film material and impurity are of considerable importance in explaining observed experimental data.
Keywords
Charge carrier processes; Coatings; Dielectric films; Dielectric radiation effects; Laser radiation effects; Optical materials/devices; Pulsed lasers; Absorption; Dielectric thin films; Impurities; Inspection; Ionization; Laser modes; Laser theory; Laser transitions; Optical films; Optical pulses;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1981.1070650
Filename
1070650
Link To Document