• DocumentCode
    1083579
  • Title

    Temperature distribution in cylinder symmetric MM-wave devices

  • Author

    Luy, Johann-Friedrich ; Schmidl, Jürgen

  • Author_Institution
    Res. Center, Daimler-Benz AG, Ulm, Germany
  • Volume
    42
  • Issue
    4
  • fYear
    1994
  • fDate
    4/1/1994 12:00:00 AM
  • Firstpage
    573
  • Lastpage
    579
  • Abstract
    A general solution of the nonlinear heat equation for temperature dependent thermal conductivity has been developed in cylinder coordinates. The solution is helpful in the design and analysis of high frequency power devices and circuits. The application to diamond heatsinks leads to a design rule height of diamond≈0.5×radius of diamond. Coplanar circuits with an active device modeled as a focal plane can be analyzed. Due to the temperature dependent thermal conductivity the thermal resistance becomes dependent on the input power. Especially for small radii of the focal plane and large input powers significant deviations from the approximation “constant thermal conductivity” result. The results are used to calculate the maximum current density of monolithically integrated transit time devices. The comparison with experimental results yields a rather good agreement
  • Keywords
    MMIC; diamond; heat sinks; microwave integrated circuits; solid-state microwave devices; temperature distribution; thermal analysis; thermal conductivity of solids; thermal resistance; coplanar circuits; cylinder coordinates; cylinder symmetric MM-wave devices; design rule height; diamond heatsinks; high frequency power devices; maximum current density; monolithically integrated transit time devices; nonlinear heat equation; temperature dependent thermal conductivity; temperature distribution; thermal resistance; Boundary conditions; Circuits; Cogeneration; Geometry; Heat sinks; Millimeter wave measurements; Temperature dependence; Temperature distribution; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.285062
  • Filename
    285062